Specimen preparation for transmission electron microscopy of materials IV

Specimen preparation for transmission electron microscopy of materials IV

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Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This volume, the 4th in a successful series from MRS, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the volume are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semi-conducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.EXPERIMENTAL TECHNIQUES The advantage to the lift-out technique is that virtually no initial specimen ... A schematic diagram of the important aspects of the technique is illustrated in fig. ... Next a aquot;stair stepaquot; trench of total dimension of approximately 5 urn wide x 30 urn long x 5 u.m deep (at the deepest step) is sputteredanbsp;...


Title:Specimen preparation for transmission electron microscopy of materials IV
Author: Ron M. Anderson, Scott D. Walck
Publisher: - 1997
ISBN-13:

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